The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...
Over the last 20 years, the proliferation of research utilizing scanning electron microscopy (SEM) has driven the performance of systems towards higher resolution at lower voltages. This enthusiasm is ...
A scanning electron microscope, acquired in 2016 with a grant from the National Science Foundation, provides a powerful tool for students, faculty, and visiting researchers to study the structure and ...
Physicists have designed a framework that allows scientists to observe interactions between light and electrons using a traditional scanning electron microscope. The procedure is considerably cheaper ...
Transmission Electron Microscope: FEI Talos F200s Scanning Transmission Electron Microscope (S/TEM) equipped with SuperX-EDS detector FEI Single Tilt Holder FEI Double Tilt Holder FEI Double Tilt ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Hitachi SU3800SE and SU3900SE scanning ...
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